• DocumentCode
    1444232
  • Title

    Analysis of SOI CMOS Microprocessor´s SEE Sensitivity: Correlation of the Results Obtained by Different Test Methods

  • Author

    Gorbunov, Maxim S. ; Vasilegin, Boris V. ; Antonov, Andrey A. ; Osipenko, Pavel N. ; Zebrev, Gennady I. ; Anashin, Vasily S. ; Emeliyanov, Vladimir V. ; Ozerov, Alexander I. ; Useinov, Rustem G. ; Chumakov, Alexander I. ; Pechenkin, Alexander A. ; Yanenko

  • Author_Institution
    Computation Engineering Department (ORVT) of Scientific Research Institute of System Analysis, Russian Academy of Sciences, Moscow, Russia
  • Volume
    59
  • Issue
    4
  • fYear
    2012
  • Firstpage
    1130
  • Lastpage
    1135
  • Abstract
    The results on SEE sensitivity of 0.5 \\mu m SOI CMOS microprocessor are presented and discussed. The comparative analysis of different test techniques (particle accelerator, pulsed laser technique and ^{252} Cf fission source) is provided for the cache. The possible sources of discrepancies between test results and the ways of data correction and methods of testing techniques\´ accuracy improvement are discussed.
  • Keywords
    Cache memory; Lasers; Logic gates; Microprocessors; Radiation effects; Registers; Sensitivity; CMOS; Cf-252; SEE; SEFI; SOI; heavy ions; laser; microprocessor;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2183147
  • Filename
    6148323
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1444232