DocumentCode
1445073
Title
Perturbation method for dielectric constant measurement of thick-film dielectric materials at microwave frequencies
Author
Li, Di-Jie ; Free, C.E. ; Pitt, K.E.G. ; Barnwell, P.G.
Author_Institution
Middlesex Univ., London
Volume
34
Issue
21
fYear
1998
fDate
10/15/1998 12:00:00 AM
Firstpage
2042
Lastpage
2044
Abstract
A novel technique, using a cavity perturbation method, for measuring the relative permittivity of dielectric thick-film materials is presented. Measurement data have been obtained at X-band frequencies for two kinds of dielectric thick-film material. The method combines simplicity with high accuracy and has the potential to measure films as thin as 20 μm
Keywords
dielectric materials; microwave measurement; permittivity measurement; thick films; X-band; cavity perturbation method; dielectric constant measurement; microwave frequency; relative permittivity; thick film dielectric material;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19981392
Filename
729901
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