DocumentCode
14464
Title
PB+ -Tree: PCM-Aware B+ -Tree
Author
Gyu Sang Choi ; Byung-Won On ; Ingyu Lee
Author_Institution
Dept. of Inf. & Commun. Eng., Yeungnam Univ., Gyeongsan, South Korea
Volume
27
Issue
9
fYear
2015
fDate
Sept. 1 2015
Firstpage
2466
Lastpage
2479
Abstract
Phase change memory (PCM) is non-volatile memory that is byte-addressable. It is two to four times denser than DRAM, orders of magnitude better than NAND Flash memory in read latency, and 10 times better than NAND Flash memory in write endurance. However, it still limits the number of write operations to at most 106 times per PCM cell. To extend its lifetime, it is necessary to evenly distribute write operations over all the memory cells. Up to now, the B+-Tree index structure has been used to quickly locate a search key in a relational database management system (RDBMS). All the record keys in each node are sorted and packed upon insertion in, and deletion from, the B+-Tree. In addition, a counter keeps track of the number of valid keys in the B+-Tree. Consequently, a B+-Tree algorithm results in a large number of write operations, which deteriorates the endurance of PCM. This restricts the usage of PCM on a database server and deteriorates performance of database servers. In this paper, we propose a novel PCM-aware B+-Tree index structure, called PB+-Tree, to provide wear-leveling in PCM. According to our experiment results, PB+-Tree is much faster than the existing B+-Tree algorithms for PCM and NAND Flash memory with versatile workloads. More importantly, our scheme also greatly reduces the number of write operations compared to other B+-Tree algorithms. All of these results suggest that PB+-Tree is the B+-Tree algorithm best fitted to PCM.
Keywords
DRAM chips; NAND circuits; flash memories; phase change memories; relational databases; trees (mathematics); B+-tree index structure; DRAM; NAND flash memory; PB+-tree; PCM-aware B+-tree; RDBMS; nonvolatile memory; phase change memory; read latency; relational database management system; Flash memories; Indexes; Memory management; Nonvolatile memory; Phase change materials; Radiation detectors; Random access memory; B+-Tree; NAND Flash memory; PCM;
fLanguage
English
Journal_Title
Knowledge and Data Engineering, IEEE Transactions on
Publisher
ieee
ISSN
1041-4347
Type
jour
DOI
10.1109/TKDE.2015.2419660
Filename
7079470
Link To Document