DocumentCode
1447223
Title
Properties of Digital Switching Currents in Fully CMOS Combinational Logic
Author
Boselli, Giorgio ; Trucco, Gabriella ; Liberali, Valentino
Author_Institution
Dept. of Inf. Technol., Univ. degli Studi di Milano, Crema, Italy
Volume
18
Issue
12
fYear
2010
Firstpage
1625
Lastpage
1638
Abstract
In this paper, we present a model to derive statistical properties of digital noise due to logic transitions of gates in a fully CMOS combinational circuit. Switching activity of logic gates in a digital system is a deterministic process, depending on both circuit parameters and input signals. However, the huge number of logic blocks in a complex IC makes digital switching a cognitively stochastic process. For a combinational logic network, we can model digital switching currents as stationary shot noise processes, deriving both their amplitude distributions and their power spectral densities. From the spectra of digital currents, we can also calculate the spectral components and the rms value of disturbances injected into the on-chip power supply lines. The stochastic model for switching currents has been validated by comparing theoretical results with circuit simulations.
Keywords
CMOS logic circuits; circuit noise; circuit simulation; circuit switching; combinational circuits; logic gates; stochastic processes; amplitude distributions; circuit simulations; deterministic process; digital noise; digital switching currents; fully CMOS combinational logic; logic gates; on-chip power supply lines; power spectral densities; stationary shot noise processes; stochastic process; CMOS digital integrated circuits; CMOS logic circuits; Combinational circuits; Digital systems; Integrated circuit noise; Logic circuits; Logic gates; Semiconductor device modeling; Signal processing; Switching circuits; Digital switching noise; power spectral density; shot noise; stochastic processes;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2009.2025883
Filename
5256138
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