Stacking faults in Co-alloy longitudinal media

Author

Lu, B. ; Zou, Jie ; Lambeth, David N. ; Laughlin, David E.

Author_Institution

Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2357

Lastpage

2359

Abstract

Stacking faults in CoCrTa/Cr, CoCrPt/NiAl, and CoCrPt/Cr/NiAl films have been studied by electron diffraction. Interfacial lattice match and epitaxial growth play important roles in reducing the stacking fault density. It is found that the bicrystal media has large stacking fault densities. In the unicrystal media case, when good epitaxy between magnetic layer and underlayer cannot be achieved, there are mainly randomly oriented grains in the magnetic layer. These random grains have a high stacking fault density

Keywords

aluminium alloys; bicrystals; chromium; chromium alloys; cobalt alloys; electron diffraction; epitaxial growth; magnetic epitaxial layers; magnetic recording; nickel alloys; platinum alloys; sputtered coatings; stacking faults; tantalum alloys; Co-alloy longitudinal media; CoCrPt; CoCrPt/Cr/NiAl films; CoCrPt/NiAl films; CoCrTa; CoCrTa/Cr films; Cr; NiAl; bicrystal media; electron diffraction; epitaxial growth; epitaxy; interfacial lattice match; magnetic layer; randomly oriented grains; stacking faults; underlayer; unicrystal media; Chromium; Diffraction; Electrons; Epitaxial growth; Lattices; Magnetic separation; Perpendicular magnetic recording; Stacking; Substrates; X-ray scattering;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908429

Filename

908429