Co-Cr-Ta perpendicular magnetic recording media using Pt seed layer

Author

Sato, Atsushi ; Nakagawa, Shigeki ; Naoe, Masahiko

Author_Institution

Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2387

Lastpage

2389

Abstract

Co₇₇Cr₂₀Ta₃ films were deposited on a Pt seed layer, and their crystallographic and magnetic characteristics were investigated. The Co-Cr-Ta/Pt bilayered films deposited at the substrate temperature of 250°C revealed excellent c-axis orientation and exhibited high perpendicular coercivity. For the Co-Cr-Ta/Pt/Ti trilayered films, Ti underlayer promoted fine granulation in the Pt layer and improved magnetic characteristics of the ultra-thin Co-Cr-Ta recording layer. Media noise level of the Co-Cr-Ta/Pt disk was small at high recording density range. The Co-Cr-Ta/Pt bilayered films are useful for fabrication of perpendicular magnetic recording media

Keywords

chromium alloys; cobalt alloys; coercive force; magnetic multilayers; magnetic recording noise; perpendicular magnetic recording; sputtered coatings; tantalum alloys; 250 degC; Co-Cr-Ta perpendicular magnetic recording media; Co₇₇Cr₂₀Ta₃; Co₇₇Cr₂₀Ta₃ films; Pt; Pt seed layer; Ti; Ti underlayer; bilayered films; c-axis orientation; crystallographic characteristics; fabrication; fine granulation; high recording density range; magnetic characteristics; media noise level; perpendicular coercivity; substrate temperature; trilayered films; Chromium; Crystallization; Crystallography; Magnetic anisotropy; Magnetic films; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Substrates; Temperature; X-ray scattering;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908440

Filename

908440