Effect of soft magnetic underlayer on magnetization microstructure of perpendicular thin film media

Author

Honda, Yukio ; Kikukawa, Atsushi ; Hirayama, Yoshiyuki ; Futamoto, Masaaki

Author_Institution

Central Res. Lab., Hitachi Ltd., Tokyo, Japan

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2399

Lastpage

2401

Abstract

Analytical magnetic force microscopy has been applied to investigate the relationship between the soft magnetic underlayer and the microscopic magnetization structures of double layered perpendicular media. The magnetization structures of the CoCrPtTa perpendicular media with Co-Nb-Zr, Co-Ta-Zr, Fe-Ta-C, and Fe-Al-Si soft magnetic underlayers are compared. The medium with Co-Ta-Zr underlayer shows low medium noise and high resolution characteristics at high recording densities. The magnetization irregularities of perpendicular media are strongly affected by the soft magnetic underlayer material

Keywords

chromium alloys; cobalt alloys; magnetic force microscopy; magnetic recording noise; magnetic thin films; magnetisation; perpendicular magnetic recording; platinum alloys; soft magnetic materials; tantalum alloys; CoCrPtTa; CoCrPtTa perpendicular media; CoNbZr; CoTaZr; FeAlSi; FeTaC; analytical magnetic force microscopy; double layered perpendicular media; high recording densities; high resolution characteristics; low medium noise; magnetization microstructure; microscopic magnetization structures; perpendicular thin film media; soft magnetic underlayer; Amorphous magnetic materials; Magnetic films; Magnetic force microscopy; Magnetic noise; Magnetic recording; Microstructure; Perpendicular magnetic recording; Saturation magnetization; Soft magnetic materials; Transmission electron microscopy;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908445

Filename

908445