DocumentCode
1447893
Title
Effect of seedlayer and junction geometry on permanent magnet stabilization of magnetoresistive heads
Author
Sharma, Nirupama ; Rea, Chris ; O´Kane, William
Author_Institution
Seagate Technol. Ireland, Springtown, UK
Volume
36
Issue
5
fYear
2000
fDate
9/1/2000 12:00:00 AM
Firstpage
2496
Lastpage
2498
Abstract
The dependence of CoPt stabilization properties on surface topography and seedlayer thickness has been investigated. The coercivity degrades drastically without a Cr seed, showing a dependence upon surface angle. Using the resulting data wafer level sensor structures are micromagnetic simulated. Poor seedlayer coverage on the junction edge yields open transfer curve loops and degraded sensor response
Keywords
cobalt alloys; magnetic heads; magnetoresistive devices; permanent magnets; platinum alloys; surface topography; CoPt; degraded sensor response; junction edge; junction geometry; magnetoresistive heads; micromagnetic simulation; open transfer curve loops; permanent magnet stabilization; seedlayer geometry; surface angle; surface topography; wafer level sensor structures; Anisotropic magnetoresistance; Coercive force; Geometry; Magnetic films; Magnetic heads; Magnetic properties; Magnetic sensors; Permanent magnets; Substrates; Surface topography;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.908485
Filename
908485
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