• DocumentCode
    1448123
  • Title

    Two new measurement methods for explicit determination of complex permittivity

  • Author

    Wan, Changhua ; Nauwelaers, Bart ; De Raedt, Walter ; Van Rossum, Marc

  • Volume
    46
  • Issue
    11
  • fYear
    1998
  • fDate
    11/1/1998 12:00:00 AM
  • Firstpage
    1614
  • Lastpage
    1619
  • Abstract
    This paper presents two new measurement methods for explicit determination of complex permittivity. For the first time, these methods combine the explicit algorithm with a simplified yet accurate error-correction technique. The combination is made possible by the use of one sample of single length and another of double length. For low-loss materials, one of the methods is valid for any sample length and independent of sample positions, but needs a prior estimate of the permittivity, while the other requires no such estimate, but avoidance of the single length being multiples of half-wavelength in the sample. For high-loss materials, both methods may need the estimate. Advantages of each method can be taken if both methods are used simultaneously. Experimental results from the proposed methods show excellent agreement with those from a recent iterative method. Errors arising from small deviations from the double length are also analyzed and presented. The validity, explicitness, and simple error-correction capability make the new methods very useful
  • Keywords
    S-parameters; calibration; error analysis; error correction; measurement errors; microwave measurement; permittivity measurement; complex permittivity; error-correction technique; explicit algorithm; high-loss materials; low-loss materials; measurement methods; Calibration; Error correction; Humans; Iterative methods; Permeability; Permittivity measurement; Physics; Reflection; Scattering parameters; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.734537
  • Filename
    734537