A study of ESD sensitivities of bottom-synthetic recording heads

Author

Lam, Chung F. ; Barlow, Irmela C.

Author_Institution

Read-Rite Corp., Fremont, CA, USA

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2614

Lastpage

2616

Abstract

This paper summarizes the behaviors of bottom-synthetic spin-valve recording heads in the spin-stand magnetic test and quasi-static test when the heads were subjected to simulated human-body model events. Magnetic test includes the parametric, bit-error-rate and micro-track profile tests. It was demonstrated that the ESD sensitivity is dependent on the structural volume. The single peak of micro-track profile changed to double or triple peaks, and the bit-error rate degraded only when the ESD energy was sufficiently large. Compared with all other parameters, the peak-to-peak amplitude in quasi-static test and the track-average-amplitude in magnetic test are the most sensitive to ESD events

Keywords

electrostatic discharge; giant magnetoresistance; magnetic heads; spin valves; ESD sensitivities; GMR; bit-error-rate test; bottom-synthetic recording heads; microtrack profile test; parametric test; quasi-static test; simulated human-body model events; spin-stand magnetic test; spin-valve recording heads; structural volume dependence; track-average-amplitude; transfer-curve reversal; Bit error rate; Degradation; Discrete event simulation; Electrostatic discharge; Frequency; Hafnium; Magnetic heads; Magnetic recording; Testing; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908533

Filename

908533