A novel magnetic force microscope probe design

Author

Windmill, James F C ; Clegg, Warwick W

Author_Institution

Centre for Res. in Inf. Storage Technol., Plymouth Univ., UK

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2984

Lastpage

2986

Abstract

A new theoretical electromagnetic probe for the magnetic force microscope (MFM) is presented here. The magnetic field intensity normal to the probe, H_z(Oe), has been modeled. The reciprocity principle was used to obtain the force acting on the sample due to the probe field when scanned over a magnetic specimen. Thus, images of specimen magnetic distribution were created by the convolution of the distribution and the probe´s gradient field. These show that in the case of perpendicular magnetization the new probe was successful. However, in longitudinal magnetization there was an image artifact problem. The practical use of the new probe is discussed, and future work outlined

Keywords

magnetic force microscopy; magnetisation; MFM; electromagnetic probe; gradient field; image artifact problem; longitudinal magnetization; magnetic field intensity; magnetic force microscope probe design; perpendicular magnetization; reciprocity principle; specimen magnetic distribution; Apertures; Biological materials; Current density; Instruments; Magnetic fields; Magnetic force microscopy; Magnetic forces; Magnetization; Perpendicular magnetic recording; Probes;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908649

Filename

908649