Stochastic Analysis of Switched-Capacitor Circuits for Sampled Data Converters

Author

Maffezzoni, Paolo

Author_Institution

Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy

Volume

31

Issue

3

fYear

2012

fDate

3/1/2012 12:00:00 AM

Firstpage

432

Lastpage

436

Abstract

This paper describes an original simulation-based method to derive the stochastic properties of the output noise of switched-capacitor circuits which are used in sampled-data converters. The method relies on a linear time-varying approximation of the large-signal transient response of the switched circuits. It is shown how switched-capacitor-circuit noise and quantization noise, due to the presence of harsh comparators, can be analyzed in a unified frame where the data converter is modeled as a discrete-time system.

Keywords

CMOS integrated circuits; discrete time systems; integrated circuit noise; sampled data circuits; stochastic processes; switched capacitor filters; transient response; discrete-time system; harsh comparator; large-signal transient response; linear time-varying approximation; quantization noise; sampled data converter; simulation-based method; stochastic analysis; switched-capacitor-circuit noise; Computational modeling; Integrated circuit modeling; Mathematical model; Noise; Stochastic processes; Switched capacitor circuits; Switches; Discrete-time systems; noise analysis; switched-capacitor circuits;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.2011.2170570

Filename

6152779