• DocumentCode
    1449916
  • Title

    Multiferroic Properties of Hexagonal YbMnO _{3} Thin Films

  • Author

    Han, T.C. ; Lin, J.G.

  • Author_Institution
    Dept. of Appl. Phys., Nat. Univ. of Kaohsiung, Kaohsiung, Taiwan
  • Volume
    45
  • Issue
    10
  • fYear
    2009
  • Firstpage
    4265
  • Lastpage
    4267
  • Abstract
    The hexagonal (HX) YbMnO3 thin films were synthesized on the substrates of (111)Y2O3:ZrO2 and (111)Pt/(0001)Al2O3 by pulsed laser deposition (PLD), and their structural, magnetic, and electrical properties are measured. The temperature-dependent magnetization clearly displays an antiferromagnetic ordering near 80 K with field perpendicular to the film surface. In the curve of polarization-voltage, the HX-YbMnO3 thin films show distinct ferroelectricity with the room-temperature remanent polarization and coercive field being 1.1 muC/cm2 and 58 kV/cm, respectively. These results indicate that the HX-YbMnO3 thin films are prominent candidates for the applications of multiferroic devices.
  • Keywords
    antiferromagnetic materials; coercive force; dielectric polarisation; ferroelectric thin films; magnetic thin films; multiferroics; pulsed laser deposition; ytterbium compounds; (111)Pt-(0001)Al2O3; (111)Y2O3:ZrO2; PLD; Pt-Al2O3; Y2O3:ZrO2; YbMnO3; antiferromagnetic ordering; coercive field; electrical properties; ferroelectricity; hexagonal thin films; magnetic properties; magnetization; multiferroics; pulsed laser deposition; remanent polarization; structural properties; Hexagonal; YbMnO $_{3}$; manganites; multiferroics;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2009.2023423
  • Filename
    5257118