DocumentCode
1449916
Title
Multiferroic Properties of Hexagonal YbMnO
Thin Films
Author
Han, T.C. ; Lin, J.G.
Author_Institution
Dept. of Appl. Phys., Nat. Univ. of Kaohsiung, Kaohsiung, Taiwan
Volume
45
Issue
10
fYear
2009
Firstpage
4265
Lastpage
4267
Abstract
The hexagonal (HX) YbMnO3 thin films were synthesized on the substrates of (111)Y2O3:ZrO2 and (111)Pt/(0001)Al2O3 by pulsed laser deposition (PLD), and their structural, magnetic, and electrical properties are measured. The temperature-dependent magnetization clearly displays an antiferromagnetic ordering near 80 K with field perpendicular to the film surface. In the curve of polarization-voltage, the HX-YbMnO3 thin films show distinct ferroelectricity with the room-temperature remanent polarization and coercive field being 1.1 muC/cm2 and 58 kV/cm, respectively. These results indicate that the HX-YbMnO3 thin films are prominent candidates for the applications of multiferroic devices.
Keywords
antiferromagnetic materials; coercive force; dielectric polarisation; ferroelectric thin films; magnetic thin films; multiferroics; pulsed laser deposition; ytterbium compounds; (111)Pt-(0001)Al2O3; (111)Y2O3:ZrO2; PLD; Pt-Al2O3; Y2O3:ZrO2; YbMnO3; antiferromagnetic ordering; coercive field; electrical properties; ferroelectricity; hexagonal thin films; magnetic properties; magnetization; multiferroics; pulsed laser deposition; remanent polarization; structural properties; Hexagonal; YbMnO $_{3}$ ; manganites; multiferroics;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2009.2023423
Filename
5257118
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