• DocumentCode
    1450519
  • Title

    A 1024-element high-performance silicon tactile imager

  • Author

    Suzuki, Kenichiro ; Najafi, Khalil ; Wise, Kensall D.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    37
  • Issue
    8
  • fYear
    1990
  • fDate
    8/1/1990 12:00:00 AM
  • Firstpage
    1852
  • Lastpage
    1860
  • Abstract
    A 32×32-element capacitive silicon tactile imager, for use in precision robotics applications where high density and high resolution are important, is discussed. The silicon chip measures 1.6 cm×1.6 cm, and is organized in an X-Y matrix of 1024 capacitor elements on 0.5-mm centers. The process uses two boron diffusions (deep and shallow) followed by a silicon-to-glass electrostatic bonding step and subsequent unmasked wafer dissolution. This results in a thick center plate for the sense capacitor supported by thinner beams. Only four noncritical masking steps for silicon and two for glass are required. A measured force sensitivity of 0.27 pF/gmf/element, temperature sensitivity of less than 3o p.p.m./°C, and maximum operating force of ≈1 gm/element has been obtained. A discrete data acquisition system used with the device offers over 6 b of force resolution, and the imager can be read at a rate of 15-20 μs/element, offering an effective frame rate of 5.1 ms
  • Keywords
    capacitors; electric sensing devices; elemental semiconductors; integrated circuit technology; silicon; tactile sensors; 1.6 cm; 1024 pixel; 15 to 20 mus; 5.1 ms; Si tactile imager; force resolution; force sensitivity; four noncritical masking steps; frame rate; high resolution; maximum operating force; precision robotics applications; sense capacitor; temperature sensitivity; unmasked wafer dissolution; Boron; Capacitors; Diffusion bonding; Electrostatic measurements; Force measurement; Image resolution; Robots; Semiconductor device measurement; Silicon; Wafer bonding;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.57136
  • Filename
    57136