• DocumentCode
    1451103
  • Title

    Modeling and Testing of Ethernet Transformers

  • Author

    Bowen, David ; Mayergoyz, Isaak D. ; Zhang, Zhenyu ; McAvoy, Patrick ; Krafft, Charles ; Kroop, David

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Maryland, College Park, MD, USA
  • Volume
    45
  • Issue
    10
  • fYear
    2009
  • Firstpage
    4793
  • Lastpage
    4796
  • Abstract
    In this paper, novel techniques for the testing and identification of lumped parameters of equivalent circuits for Ethernet transformers are presented. It is demonstrated experimentally and theoretically that resonance phenomena may occur in the loop formed by leakage inductances and cross-winding capacitance. This resonance may corrupt the pass band of the transformers transfer characteristic for differential-mode signals.
  • Keywords
    local area networks; transformers; Ethernet transformers; cross-winding capacitance; differential-mode signals; leakage inductances; lumped parameters identification; lumped parameters testing; resonance phenomena; transformers transfer characteristic; Equivalent circuits; modeling; soft magnetic materials; transformer windings;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2009.2023918
  • Filename
    5257297
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1451103