• DocumentCode
    1453952
  • Title

    An Algorithm for Efficient and Effective Evaluation of Scattering From Fractal Surfaces

  • Author

    Perna, Stefano ; Iodice, Antonio

  • Author_Institution
    Dipt. per le Tecnol. (DIT), Univ. degli Studi di Napoli Parthenope, Naples, Italy
  • Volume
    50
  • Issue
    9
  • fYear
    2012
  • Firstpage
    3554
  • Lastpage
    3566
  • Abstract
    In recent years, it has been shown that use of the Kirchhoff approximation allows expressing the field scattered by a fractal surface in terms of two series expansions. A rigorous analysis of the properties of such two series has been addressed in the recent literature, aimed at finding suitable truncation criteria to compute, with a controlled absolute error, the field scattered by a fractal surface. In this paper, we first of all note that aforementioned analysis applies not only to the Kirchhoff approach, but also to more advanced approaches for surface scattering evaluation. Then, we address the use of the aforementioned series and truncation criteria to achieve a controlled relative rather than absolute error. According to such an analysis, an algorithm is provided, which allows to automatically choose which of the two series, if any, can be used, and how it can be properly truncated for efficient and effective (i.e., with a controlled relative error) computation of the field scattered by natural surfaces. An example of the application of the proposed algorithm to synthetic aperture radar data simulation is also provided.
  • Keywords
    fractals; geophysical techniques; remote sensing; Kirchhoff approximation; controlled absolute error; fractal surface; series expansion; surface scattering evaluation; truncation criteria; Accuracy; Algorithm design and analysis; Fractals; Indexes; Scattering; Surface waves; Synthetic aperture radar; Fractals; scattering from natural surfaces; series expansions;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/TGRS.2011.2182355
  • Filename
    6155740