DocumentCode

1454059

Title

Test facilities for electronic industry

Author

Swaroop, D

Volume

11

Issue

1

fYear

1973

Firstpage

28

Lastpage

29

fLanguage

English

Journal_Title

India, IEE-IERE Proceedings -

Publisher

iet

ISSN

0018-9146

Type

jour

DOI

10.1049/iipi.1973.0007

Filename

5257862