DocumentCode
1454358
Title
Machine vision algorithms for automated inspection thin-film disk heads
Author
Sanz, Jorge L C ; Petkovic, Dragutin
Author_Institution
IBM Almaden Res. Lab., San Jose, CA, USA
Volume
10
Issue
6
fYear
1988
fDate
11/1/1988 12:00:00 AM
Firstpage
830
Lastpage
848
Abstract
Machine vision algorithms and a supporting architecture that were integrated in a fully automated prototype system for disk head inspection are presented. Some specific methods are elaborated on, including the computation of the Hough transform and multicode masks in pipeline architectures, object segmentation in textured backgrounds, and matching of extracted defects with inspection specifications. Extensive experimental results are given.
Keywords
computer vision; computerised pattern recognition; inspection; parallel architectures; transforms; Hough transform; automatic visual inspection; computer vision; computerized pattern recognition; machine vision; multicode masks; pipeline architectures; segmentation; thin-film disk heads; Computer architecture; Computer vision; Inspection; Machine vision; Machinery production industries; Magnetic heads; Manufacturing; Prototypes; System testing; Transistors;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/34.9106
Filename
9106
Link To Document