DocumentCode
1454485
Title
Novel High Robustness RF ESD Protection Circuits Applied to 5.8-GHz GaAs-Based HBT Amplifiers
Author
Huang, Bo-Jr ; Lin, Kun-You ; Chiong, Chau-Ching ; Wang, Huei
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume
59
Issue
3
fYear
2011
fDate
3/1/2011 12:00:00 AM
Firstpage
687
Lastpage
698
Abstract
In this paper, the design and analysis of two novel high robustness RF electrostatic discharge (ESD) protection are proposed in GaAs 2-μm HBT process. One incorporates with the ESD devices to form a bandpass filter structure with good impedance matching, which has eight discharging paths. The other is fabricated with parasitic capacitance reduction technique for the ESD protection, and has four discharging paths. These two protection circuits are also applied to 5.8-GHz amplifiers for demonstration. In the meanwhile, two amplifiers without ESD protection and with conventional ESD protection are fabricated in parallel for comparison. Based on the measurement results, it indicates that the two proposed ESD-protected amplifiers feature much higher ESD robustness and better RF performance than the conventional design.
Keywords
band-pass filters; electrostatic discharge; gallium arsenide; heterojunction bipolar transistors; impedance matching; microwave amplifiers; microwave filters; ESD devices; GaAs; HBT amplifiers; bandpass filter structure; electrostatic discharge; frequency 5.8 GHz; high robustness RF ESD protection circuits; impedance matching; parasitic capacitance reduction technique; size 2 mum; Electrostatic discharge; Inductors; Junctions; Parasitic capacitance; Performance evaluation; Radio frequency; Robustness; Amplifier; GaAs; HBT; electrostatic discharge (ESD) protection;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2011.2104790
Filename
5716704
Link To Document