Shape-optimized electrooptic beam scanners: experiment

Author

Fang, J.C. ; Kawas, M.J. ; Zou, J. ; Gopalan, V. ; Schlesinger, T.E. ; Stancil, D.D.

Author_Institution

Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

11

Issue

1

fYear

1999

Firstpage

66

Lastpage

68

Abstract

A new horn-shaped electrooptic scanner is described with significantly improved scanning sensitivity over rectangular-shaped devices. In the new device, the shape of the scanner is chosen to follow the trajectory of the beam. An example design is described that exhibits a factor of two larger scanning sensitivity than a rectangular device with comparable maximum scanning angle. Beam propagation simulations and measurements on an experimental device verify the scanner performance.

Keywords

electro-optical devices; optical design techniques; optical scanners; optical waveguide theory; optimisation; sensitivity; beam propagation simulations; comparable maximum scanning angle; horn-shaped electrooptic scanner; rectangular device; rectangular-shaped devices; scanner performance; scanning sensitivity; shape-optimized electrooptic beam scanners; trajectory; Electrooptic devices; Electrooptic effects; High speed optical techniques; Integrated optics; Laser beams; Optical devices; Optical polarization; Optical propagation; Optical sensors; Shape;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.736393

Filename

736393