A reliable method for extraction of material parameters in terahertz time-domain spectroscopy

Author

Duvillaret, Lionel ; Garet, Frederic ; Coutaz, Jean-Louis

Author_Institution

Lab. d´´Hyperfrequences et de Caracterisation, Savoie Univ., Le Bourget Du Lac, France

Volume

2

Issue

3

fYear

1996

fDate

9/1/1996 12:00:00 AM

Firstpage

739

Lastpage

746

Abstract

This paper introduces a novel method that allows fast and reliable extraction of material parameters in terahertz time-domain spectroscopy. This method could be applied for most materials and requires neither simplifying assumptions nor samples of different thickness for the extraction. The presented extraction procedure operates either on truncated terahertz signals when temporal windowing is possible, or on full ones otherwise. Some experimental examples covering all practical cases are given. In particular, the extraction procedure treats the tedious case of samples for which internal reflections of the terahertz pulse slightly overlap

Keywords

Fourier transform spectroscopy; convergence; refractive index; submillimetre wave spectroscopy; material parameters extraction; temporal windowing; terahertz time-domain spectroscopy; truncated terahertz signals; Frequency; Magnetic materials; Materials reliability; Optical reflection; Optical refraction; Optical variables control; Parameter extraction; Refractive index; Spectroscopy; Time domain analysis;

fLanguage

English

Journal_Title

Selected Topics in Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

1077-260X

Type

jour

DOI

10.1109/2944.571775

Filename

571775