DocumentCode
1455623
Title
NIST comparison of the quantized Hall resistance and the realization of the SI OHM through the calculable capacitor
Author
Jeffery, Anne-Marie ; Elmquist, R.E. ; Lee, Lai H. ; Shields, John Q. ; Dziuba, R.F.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume
46
Issue
2
fYear
1997
fDate
4/1/1997 12:00:00 AM
Firstpage
264
Lastpage
268
Abstract
The latest NIST result from the comparison of the quantized Hall resistance (QHR) with the realization of the SI ohm obtained from the NIST calculable capacitor is reported. A small difference between the 1988 result and the present result has led to a re-evaluation of the sources and magnitudes of possible systematic errors
Keywords
electric resistance measurement; measurement errors; measurement standards; quantum Hall effect; units (measurement); AC measurement; DC measurement; NIST comparison; SI OHM; calculable capacitor; quantized Hall resistance; systematic errors; Bridge circuits; Capacitors; Electrical resistance measurement; Electrodes; Helium; Measurement standards; Minerals; NIST; Optical interferometry; Resistors;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.571828
Filename
571828
Link To Document