• DocumentCode
    1455976
  • Title

    Multistate radiometry: noise de-embedding and “un-terminating”

  • Author

    Wiatr, Wojciech

  • Author_Institution
    Warsaw Univ. of Technol., Poland
  • Volume
    46
  • Issue
    2
  • fYear
    1997
  • fDate
    4/1/1997 12:00:00 AM
  • Firstpage
    503
  • Lastpage
    506
  • Abstract
    A noisy one-port device embedded in a noisy two-port, representing a device under test (DUT) and an rf total power radiometer is investigated from the metrology point-of-view. The output noise power, analyzed at different states of either the termination or the two-port, leads to defining relevant issues of noise “un-terminating” and de-embedding. In consequence, they both form the foundation of a novel noise approach, the multistate radiometry, applicable to simultaneous measurement of the reflection coefficient and the noise temperature of one-port devices. The method features the sole use of noise excitation and techniques of system calibration and accuracy enhancement, and thus is expected to pioneer novel means for automated noise and network analysis of these devices. Some design criteria for building an appropriate instrument, the multistate radiometer, are considered too. Because only noise power detection is employed, the six-port theory can be applied to the analysis of the system
  • Keywords
    calibration; electric noise measurement; microwave measurement; network analysers; radiometers; radiometry; accuracy enhancement; automated noise analysis; design criteria; multistate radiometer; multistate radiometry; network analysis; noise de-embedding; noise power detection; noise temperature; noisy one-port device; one-port devices; output noise power; reflection coefficient; rf total power radiometer; simultaneous measurement; six-port theory; Acoustic reflection; Calibration; Impedance measurement; Metrology; Noise measurement; Particle measurements; Power measurement; Radiometry; Temperature; Testing;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.571896
  • Filename
    571896