• DocumentCode
    1456154
  • Title

    Accuracy versus complexity in RBF neural networks

  • Author

    Alippi, Cesare ; Piuri, Vincenzo ; Scotti, Fabio

  • Author_Institution
    Dept. of Int. Process. Syst., Politecnico di Milano, Italy
  • Volume
    4
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    32
  • Lastpage
    36
  • Abstract
    We have introduced a methodology for solving the tradeoff between accuracy and complexity in complex virtual systems directly at the system level. Such methodology can be inserted in an application-level compiler for transforming a high-level description of the application into a lower level. This can then be fed into a hardware/software codesign compiler for final system implementation. Off-line integration of constraints relaxes model accuracy by introducing the concept of neural networks equivalent according to accuracy. The complexity criterion help select the smallest neural network topology within this set. The methodology is the key element for an effective high-level synthesis where few or no application tuning parameters need to be set by the designer. Indirectly, the methodology supports a system level integration of the requirement for low-power consumption, a particularly appealing constraint for embedded system design
  • Keywords
    CCD image sensors; deformation; mechanical variables measurement; network topology; radial basis function networks; railways; virtual instrumentation; wear; CCD camera; RBF neural networks; application-level compiler; complexity criterion; deformation; embedded system design; hardware/software codesign compiler; high-level description; high-level synthesis; low-power consumption; neural networks; off-line integration; railway wear; Energy consumption; Hardware; Intelligent networks; Macrocell networks; Network topology; Neural networks; Neurons; Radial basis function networks; Vectors; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/5289.911171
  • Filename
    911171