Measured backscatter from conductive thin films deposited on fibrous substrates

Author

Gurton, Kristan P. ; Bruce, Charles W. ; Gillespie, J.B.

Author_Institution

Army Res. Lab., Adelphi, MD, USA

Volume

46

Issue

11

fYear

1998

fDate

11/1/1998 12:00:00 AM

Firstpage

1674

Lastpage

1678

Abstract

The functional dependence of the electromagnetic backscatter by thin, straight, dielectric fibers with metallic coatings was measured as a function of coating thickness and conductivity at a wavelength of 0.86 cm (35 GHz). Cu and Ni coatings were applied to fibrous glass substrates (having a nominal diameter of 5.50 μm) using an evaporative process. The thicknesses of the thin films were directly measured by scanning electron microscopy (SEM) and ranged from 0.02 to 0.70 μm. Measurements were conducted using single fibers. Measured quantities agreed well with calculations based on previously developed theory

Keywords

backscatter; conductors (electric); copper; electromagnetic wave scattering; glass fibres; metallic thin films; microwave measurement; microwave spectra; nickel; scanning electron microscopy; vacuum deposited coatings; 0.02 to 0.7 micron; 0.86 cm; 2.75 micron; 35 GHz; Cu; Ni; SEM; coating thickness; coatings; conductive thin films; conductivity; diameter; electromagnetic backscatter; evaporative process; fibrous glass substrates; fibrous substrates; measured backscatter; metallic coatings; microwave frequency; scanning electron microscopy; straight dielectric fibers; wavelength; Backscatter; Coatings; Conductive films; Conductivity measurement; Dielectric measurements; Dielectric substrates; Dielectric thin films; Electromagnetic measurements; Thickness measurement; Wavelength measurement;

fLanguage

English

Journal_Title

Antennas and Propagation, IEEE Transactions on

Publisher

ieee

ISSN

0018-926X

Type

jour

DOI

10.1109/8.736620

Filename

736620