Intercomparison of silicon samples from the Avogadro projects

Author

Kessler, Ernest G., Jr. ; Schweppe, John Edward ; Deslattes, Richard D.

Author_Institution

Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

Volume

46

Issue

2

fYear

1997

fDate

4/1/1997 12:00:00 AM

Firstpage

551

Lastpage

555

Abstract

The NIST lattice comparator assesses lattice parameter differences among carefully prepared samples of monocrystalline silicon with a level of imprecision near 10^-8. This instrument has recently been used to effect intercomparisons among samples from laboratories currently engaged in direct optical measurements of such lattice periods. We report lattice parameter differences among samples representative of current optical measurements in all active national measurement laboratories. These data are suggestive of the current state of the art of these determinations and the population of silicon materials presently available for such purposes

Keywords

constants; elemental semiconductors; lattice constants; measurement standards; silicon; Avogadro projects; NIST lattice comparator; Si; Si materials; Si samples; direct optical measurement; lattice parameter; monocrystalline silicon; national measurement laboratories; optical measurement; Current measurement; Geometry; Instruments; Laboratories; Lattices; Measurement standards; NIST; Optical sensors; Silicon; X-ray diffraction;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.571909

Filename

571909