• DocumentCode
    1457044
  • Title

    Pitfalls in the Determination of Optical Cross Sections From Surface Integral Equation Simulations

  • Author

    Kern, Andreas M. ; Martin, Olivier J F

  • Author_Institution
    Nanophotonics & Metrol. Lab., Swiss Fed. Inst. of Technol. Lausanne (EPFL), Lausanne, Switzerland
  • Volume
    58
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    2158
  • Lastpage
    2161
  • Abstract
    Calculation of electromagnetic cross sections from surface integral equation simulations, a popular approach in microwave studies and recently also in optics and plasmonics, requires only a single post-processing step, which can, however, be very sensitive to the precision of the simulation result. We investigate the accuracy and robustness of two methods for cross section calculation, displaying when and why errors may occur, in certain cases even unphysical behavior. A calculation recipe which avoids unphysical results is given, ensuring convergence of all obtained cross sections. This study will help judge the accuracy of performed simulations and can prevent misinterpretation of modeling results.
  • Keywords
    electromagnetic wave scattering; integral equations; surface electromagnetic waves; electromagnetic cross sections; optical cross sections; surface integral equation; Absorption; Electromagnetic fields; Electromagnetic scattering; Electromagnetic wave absorption; Integral equations; Optical scattering; Optical sensors; Optical surface waves; Particle scattering; Plasmons; Radar cross section; Radar scattering; Absorbing media; boundary element methods; integral equations; scattering;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2010.2046870
  • Filename
    5439887