DocumentCode
1457044
Title
Pitfalls in the Determination of Optical Cross Sections From Surface Integral Equation Simulations
Author
Kern, Andreas M. ; Martin, Olivier J F
Author_Institution
Nanophotonics & Metrol. Lab., Swiss Fed. Inst. of Technol. Lausanne (EPFL), Lausanne, Switzerland
Volume
58
Issue
6
fYear
2010
fDate
6/1/2010 12:00:00 AM
Firstpage
2158
Lastpage
2161
Abstract
Calculation of electromagnetic cross sections from surface integral equation simulations, a popular approach in microwave studies and recently also in optics and plasmonics, requires only a single post-processing step, which can, however, be very sensitive to the precision of the simulation result. We investigate the accuracy and robustness of two methods for cross section calculation, displaying when and why errors may occur, in certain cases even unphysical behavior. A calculation recipe which avoids unphysical results is given, ensuring convergence of all obtained cross sections. This study will help judge the accuracy of performed simulations and can prevent misinterpretation of modeling results.
Keywords
electromagnetic wave scattering; integral equations; surface electromagnetic waves; electromagnetic cross sections; optical cross sections; surface integral equation; Absorption; Electromagnetic fields; Electromagnetic scattering; Electromagnetic wave absorption; Integral equations; Optical scattering; Optical sensors; Optical surface waves; Particle scattering; Plasmons; Radar cross section; Radar scattering; Absorbing media; boundary element methods; integral equations; scattering;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/TAP.2010.2046870
Filename
5439887
Link To Document