• DocumentCode
    1457616
  • Title

    A scalable general-purpose model for microwave FETs including DC/AC dispersion effects

  • Author

    Cojocaru, Vicentiu I. ; Brazil, Thomas J.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. Coll. Dublin, Ireland
  • Volume
    45
  • Issue
    12
  • fYear
    1997
  • fDate
    12/1/1997 12:00:00 AM
  • Firstpage
    2248
  • Lastpage
    2255
  • Abstract
    This paper addresses the issue of scalability in equivalent circuit-based models for FETs, emphasizing for the first time the particularly difficult problems associated with the scalability of dc/ac dispersion phenomena. A study has been carried out on devices from both MESFET (LG=0.5 μm) and pseudomorphic high electron-mobility transistor (PHEMT) (LG=0.2 μm) foundry processes, with total gatewidths between 60-1200 μm. Results are presented, showing that at least up to medium-size devices, dc characteristics, and most of the bias-dependent small-signal circuit elements scale in general, very well provided a reliable parameter extraction methodology is implemented. However, in the case of dispersion phenomena, while the differential dc/ac transconductance obeys straightforward scaling rules, the output conductance does not. The main features of a general-purpose scaleable microwave FET model-COBRA-are described. This includes an equivalent circuit-based solution to account for dispersion effects. The solution is compact, obeys the required conservation constraints, and can “absorb” the scaling inconsistencies observed in the output conductance. The corresponding modeling methodology is also described. Finally, a comprehensive set of measurement versus simulation scalability test results are presented, including dc, small-signal, and large-signal tests
  • Keywords
    Schottky gate field effect transistors; equivalent circuits; high electron mobility transistors; microwave field effect transistors; semiconductor device models; AC dispersion; COBRA; DC dispersion; MESFET; PHEMT; equivalent circuit; microwave FET; output conductance; parameter extraction; scalable general-purpose model; transconductance; Dispersion; Foundries; MESFETs; Microwave FETs; Microwave circuits; Microwave devices; PHEMTs; Parameter extraction; Scalability; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.643826
  • Filename
    643826