High resolution X-ray imaging using a silicon strip detector

Author

Beuville, E. ; Cahn, R. ; Cederström, B. ; Danielsson, M. ; Hall, A. ; Hasegawa, B. ; Luo, L. ; Lundqvist, M. ; Nygren, D. ; Oltman, E. ; Walton, J.

Author_Institution

Lawrence Berkeley Nat. Lab., Berkeley, CA, USA

Volume

45

Issue

6

fYear

1998

fDate

12/1/1998 12:00:00 AM

Firstpage

3059

Lastpage

3063

Abstract

The authors present the first images and an initial evaluation of a scanned-slot X-ray imaging system based on edge-on silicon strip detectors and high-speed low-noise parallel processing ASICs. The authors have demonstrated noiseless single photon counting above a minimal threshold of 7.2 keV. Edge scans show negligible cross talk between different channels in the ASIC. The Modulation Transfer Function (MTF) has been measured and found to agree with the ideal MTF for 100 μm pixel size. The first images are obtained at very low exposures and show the high performance of the system. The authors also present a way of enhancing the X-ray flux to a slot by using a refractive X-ray lens. They believe this focusing device will significantly enhance the potential for scanned-slot X-ray imaging

Keywords

X-ray detection; application specific integrated circuits; biomedical electronics; biomedical equipment; diagnostic radiography; image resolution; silicon radiation detectors; 100 mum; 7.2 keV; Si; X-ray flux enhancement; edge scans; edge-on silicon strip detectors; focusing device; high resolution X-ray imaging; high-speed low-noise parallel processing ASICs; medical diagnostic imaging; medical instrumentation; minimal threshold; negligible cross talk; noiseless single photon counting; refractive X-ray lens; scanned-slot X-ray imaging system; silicon strip detector; Application specific integrated circuits; Image edge detection; Image resolution; Parallel processing; Silicon; Strips; Transfer functions; X-ray detection; X-ray detectors; X-ray imaging;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.737664

Filename

737664