Thermal analysis of PPM-focused rod-supported TWT helix structures

Author

Crivello, Roberto ; Grow, Richard W.

Author_Institution

Dept. of Electr. Eng., Utah Univ., Salt Lake City, UT, USA

Volume

35

Issue

10

fYear

1988

fDate

10/1/1988 12:00:00 AM

Firstpage

1701

Lastpage

1720

Abstract

A thermal analysis, which can be implemented on a small computer system, has been developed for PPM (periodic permanent-magnet)-focused rod-supported TWT (traveling-wave tube) helix structures. The method fully accounts for the variable thermal conductivity of several of the materials used in helix assemblies and considers the nonuniform geometry of the various elements of the structure along the direction of heat flow. Including the effects of the thermal interface resistances, accurate predictions can thus be made of the thermal behavior of the circuit for a given power dissipation on the helix, and the influence on the helix temperature rise of the thermal and geometrical parameters of the various elements of the structure can be easily examined. An experimental test shows good agreement with the computed results and indicates that the method can be used to estimate the thermal interface resistance of experimental helix assemblies

Keywords

focusing; thermal analysis; travelling-wave-tubes; PPM focusing; TWT helix structures; helix temperature rise; materials; microwave tubes; nonuniform geometry; periodic permanent-magnet; power dissipation; rod supports; thermal analysis; thermal interface resistances; traveling-wave tube; variable thermal conductivity; Assembly; Circuit testing; Computer interfaces; Conducting materials; Geometry; Periodic structures; Power dissipation; Temperature; Thermal conductivity; Thermal resistance;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.7377

Filename

7377