• DocumentCode
    1460167
  • Title

    Nondestructive testing of insulation

  • Author

    Brancato, E. L.

  • Author_Institution
    Naval Research Laboratory, Washington, D. C.
  • Volume
    72
  • Issue
    5
  • fYear
    1953
  • fDate
    5/1/1953 12:00:00 AM
  • Firstpage
    425
  • Lastpage
    425
  • Abstract
    THE USER OF ELECTRIC APPARATUS is constantly in need of information concerning the condition of insulation. This information, at the present time, is supplied by such tests as insulation resistance, power factor, capacitance, or by more severe tests such as “high-pot.” Unfortunately, none of these tests gives a true indication of the “health” of the dielectric, but rather indicate its present condition — a condition that may exist only temporarily and can be corrected by suitable action. It is important, of course, to have this information; however, it is of equal importance in many applications to have an indication of the useful life that can be expected from the dielectric at any time during its use.
  • Keywords
    Aging; Dielectric losses; Dielectric measurements; Insulation; Resistance; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electrical Engineering
  • Publisher
    ieee
  • ISSN
    0095-9197
  • Type

    jour

  • DOI
    10.1109/EE.1953.6438660
  • Filename
    6438660