Evaluation of built-in test

Author

Pecht, M. ; Dube, M. ; Natishan, M. ; Williams, R. ; Banner, J. ; Knowles, I.

Author_Institution

CALCE Center for Electron. Packaging, Maryland Univ., College Park, MD, USA

Volume

37

Issue

1

fYear

2001

fDate

1/1/2001 12:00:00 AM

Firstpage

266

Lastpage

271

Abstract

Built-in test (BIT) provides fault finding as a means to aid in system assembly, test, and maintenance. An investigation to evaluate BIT of a particular electronics board used in the in-flight entertainment system for Boeing 777s is described. We found BIT proved useful when failure occurrences were uniquely associated with the operating environment, situations which can result in no-fault found, or could-not duplicate (CND) failures upon test. We also observed cases where the BIT failed to observe failures, and in some cases pointed to the wrong cause of failure. These and other advantages and disadvantages of BIT implementation are discussed

Keywords

built-in self test; entertainment; failure analysis; fault diagnosis; microprocessor chips; multichip modules; printed circuit testing; BIST; BIT; Boeing 777; automatic testing; built-in test; failure duplication; fault finding; in-flight entertainment; seat back electronic processor boards; Aerospace electronics; Assembly systems; Built-in self-test; Circuit faults; Circuit testing; Condition monitoring; Electronic equipment; Military equipment; Procurement; System testing;

fLanguage

English

Journal_Title

Aerospace and Electronic Systems, IEEE Transactions on

Publisher

ieee

ISSN

0018-9251

Type

jour

DOI

10.1109/7.913684

Filename

913684