• DocumentCode
    1460557
  • Title

    Benchmarking semiconductor manufacturing performance using a pairwise-comparison method

  • Author

    Saeed, B.I.

  • Volume
    10
  • Issue
    2
  • fYear
    1997
  • fDate
    5/1/1997 12:00:00 AM
  • Firstpage
    317
  • Lastpage
    321
  • Abstract
    Benchmarking performance against competitors is an increasingly popular activity within the semiconductor industry. Owing to the high variability in manufacturing metrics, a simple monthly metric score is usually insufficient to accurately benchmark performance. However, in the rapidly changing semiconductor world, data which are one to two years old may be irrelevant to the current situation. We propose a simple ranking method based on a method of paired-comparisons for unbalanced data which gives a good ranking and is also reliable under fluctuations in the data. Using semiconductor manufacturing performance data from the Competitive Semiconductor Manufacturing Study at the University of California at Berkeley, we give an example of this method and compare its reliability and accuracy against other techniques through simulations
  • Keywords
    integrated circuit manufacture; semiconductor device manufacture; simulation; statistical analysis; manufacturing metrics; manufacturing performance data; pairwise-comparison method; performance benchmarking; ranking method; semiconductor industry; semiconductor manufacturing performance; Electronics industry; Fabrication; Fluctuations; Industrial engineering; Operations research; Semiconductor device manufacture; Semiconductor device reliability; Steady-state; Throughput; Virtual manufacturing;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.572087
  • Filename
    572087