Radiation damage studies of silicon microstrip sensors

Author

Nakayama, T. ; Arai, S. ; Hara, K. ; Shimojima, M. ; Ikegami, Y. ; Iwata, Y. ; Johansen, L.G. ; Kobayashi, H. ; Kohriki, T. ; Kondo, T. ; Nakano, I. ; Ohsugi, T. ; Riedler, P. ; Roe, S. ; Stapnes, S. ; Stugu, B. ; Takashima, R. ; Tanizaki, K. ; Terada, S.

Author_Institution

Inst. of Phys., Tsukuba Univ., Ibaraki, Japan

Volume

47

Issue

6

fYear

2000

fDate

12/1/2000 12:00:00 AM

Firstpage

1885

Lastpage

1891

Abstract

Various types of large area silicon microstrip detectors were fabricated for the development of radiation-tolerant detectors that will operate in the LHC ATLAS SCT. The detectors were irradiated with 12-GeV protons at KEK to fluences of 1.7×10¹⁴ and 4.2×10 ¹⁴ protons/cm². Irradiated samples included n-on-n detectors with 4 kΩcm bulk resistivity and p-on-n detectors with 1 kΩcm and 4 kΩcm bulk resistivities. Four patterns of p-stop structures are configured in the n-on-n detectors. Although Hamamatsu fabricated most of the detectors, p-on-n detectors by SINTEF are also included, as well as those fabricated in a modified process by Hamamatsu. The detector performances after irradiation that are compared are the probability of creation of faulty coupling capacitors, C-V characteristics, charge curves, and total leakage current. The p-on-n are similar to the n-on-n detectors in these performances, and will remain operational in the ATLAS radiation environment

Keywords

position sensitive particle detectors; proton detection; proton effects; radiation hardening; silicon radiation detectors; 12 GeV; C-V characteristics; LHC ATLAS SCT; Si; Si microstrip sensors; charge curves; large area microstrip detectors; n-on-n detectors; p-on-n detectors; p-stop structures; proton; radiation damage studies; radiation-tolerant detectors; total leakage current; Capacitance-voltage characteristics; Capacitors; Conductivity; Fault detection; Large Hadron Collider; Leak detection; Microstrip; Protons; Radiation detectors; Silicon radiation detectors;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.914464

Filename

914464