DocumentCode
1462727
Title
Testing point-contact transistors for pulse applications
Author
Wooley, R. L.
Author_Institution
General Electric Company, Advanced Electronics Center at Cornell University, Ithaca, N. Y.
Volume
73
Issue
11
fYear
1954
Firstpage
981
Lastpage
987
Abstract
Test methods are recommended and described. Conclusions are drawn regarding measurements for determination of proper application of transistors to large-signal pulse circuits.
Keywords
Current measurement; Electrical resistance measurement; Integrated circuits; Resistance; Resistors; Transistors; Voltage measurement;
fLanguage
English
Journal_Title
Electrical Engineering
Publisher
ieee
ISSN
0095-9197
Type
jour
DOI
10.1109/EE.1954.6439073
Filename
6439073
Link To Document