Electrooptic mapping of near-field distributions in integrated microwave circuits

Author

Yang, Kyoung ; David, Gerhard ; Robertson, Stephen V. ; Whitaker, John F. ; Katehi, Linda P B

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA

Volume

46

Issue

12

fYear

1998

fDate

12/1/1998 12:00:00 AM

Firstpage

2338

Lastpage

2343

Abstract

A field mapping system based on external electrooptic sampling has been developed in order to determine the vectorial components of the electric near-field distribution within microwave integrated circuits. The capabilities of the setup are demonstrated by two-dimensional measurements of normal and tangential fields in a coplanar microwave distribution network at frequencies up to 15 GHz. Results obtained on a functioning power-distribution network, as well as on two nonfunctioning networks, show the ability of the technique to interrogate internal circuit operation and to isolate faults through investigation of the field distributions

Keywords

coplanar waveguide components; electric field measurement; electro-optical devices; integrated circuit testing; microwave integrated circuits; microwave measurement; 15 GHz; MIC testing; coplanar microwave distribution network; electro-optic probe station; electrooptic mapping; external electrooptic sampling; field mapping system; integrated microwave circuits; near-field distributions; power-distribution network; tangential fields; two-dimensional measurements; vectorial components; Antenna measurements; Electric variables measurement; Electromagnetic measurements; Integrated circuit measurements; Microwave integrated circuits; Microwave measurements; Optical sensors; Probes; Sampling methods; Ultrafast optics;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.739221

Filename

739221