Electric field mapping system using an optical-fiber-based electrooptic probe

Author

Yang, K. ; Katehi, Linda P B ; Whitaker, J.F.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA

Volume

11

Issue

4

fYear

2001

fDate

4/1/2001 12:00:00 AM

Firstpage

164

Lastpage

166

Abstract

A microwave electric-field mapping system based on electrooptic sampling has been developed using micromachined GaAs crystals mounted on gradient index lenses and single-mode optical fibers. The probes are able to detect three orthogonal polarizations of electric fields and, due to the flexibility and size of the optical fiber, can be positioned not only from the extreme near-field to the far-field regions of microwave and millimeter-wave structures, but also inside of enclosures such as waveguides and packages.

Keywords

electric field measurement; electro-optical devices; fibre optic sensors; microwave measurement; millimetre wave measurement; probes; GaAs; MM-wave structures; electric-field mapping system; electrooptic sampling; enclosures; far-field radiation patterns; gradient index lenses; micromachined GaAs crystals; microwave structures; near-field radiation patterns; optical-fiber-based electrooptic probe; orthogonal polarizations detection; packages; single-mode optical fibers; waveguides; Crystals; Gallium arsenide; Lenses; Optical fiber polarization; Optical fibers; Optical waveguides; Packaging; Probes; Sampling methods; Ultraviolet sources;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/7260.916331

Filename

916331