DocumentCode
1465693
Title
Reliability physics in electronics: a historical view
Author
Ebel, George H.
Author_Institution
IIT Res. Inst., Rome, Italy
Volume
47
Issue
3
fYear
1998
fDate
9/1/1998 12:00:00 AM
Abstract
This paper traces the development of the reliability approach for microelectronic devices. It discusses the pressures on the early military microelectronics industry to improve the reliability of individual parts making up the complex equipment. This pressure led to the need for a new approach to designing and evaluating these parts. The resulting birth of reliability physics is covered in detail, followed by the subsequent growth and eventually the creation of many specialty areas within reliability physics
Keywords
history; integrated circuit reliability; military equipment; individual parts reliability improvement; microelectronic devices; military microelectronics industry; reliability physics; Dielectric devices; Electronics packaging; Failure analysis; Hot carriers; Integrated circuit reliability; Microelectronics; Packaging machines; Physics; Testing; Weapons;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.740555
Filename
740555
Link To Document