An Allan variance real-time processing system for frequency stability measurements of semiconductor lasers

Author

Kuboki, K. ; Ohtsu, M.

Author_Institution

Graduate Sch. at Nagatsuta, Tokyo Inst. of Technol., Kanagawa, Japan

Volume

39

Issue

4

fYear

1990

fDate

8/1/1990 12:00:00 AM

Firstpage

637

Lastpage

641

Abstract

A real-time frequency stability measurement system for semiconductor lasers was developed. Since the frequency of the input signal is measured successively without clearing the counter, measurements of the Allan variance made with this system are more accurate than those made with conventional instruments. The Allan variance can be measured for integration times τ from 1 μs to 10000 s, and the number N of measured frequencies averaged over the integration time τ can be arbitrarily selected up to N=707 for each integration time. The highest measurable frequency was 90 MHz. It was demonstrated experimentally that this system can be used for measurements of the frequency stability of semiconductor lasers

Keywords

laser frequency stability; laser variables measurement; semiconductor junction lasers; signal processing; 1 mus to 10000 s; 90 MHz; Allan variance real-time processing; frequency stability measurements; integration times; semiconductor lasers; Counting circuits; Frequency locked loops; Frequency measurement; Instruments; Laser stability; Latches; Optical mixing; Real time systems; Semiconductor lasers; Time measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.57247

Filename

57247