• DocumentCode
    1467886
  • Title

    Comments on "A compact physical large-signal model for high-speed bipolar transistors at high current densities-part I: one-dimensional model" (by H.-M. Rein et al., with reply)

  • Author

    Liou, Juin J. ; Rein, H.-M. ; Schroter, Michael ; Stubing, Hagen

  • Author_Institution
    Dept. of Electr. Eng., Central Florida Univ., Orlando, FL, USA
  • Volume
    35
  • Issue
    11
  • fYear
    1988
  • Firstpage
    1995
  • Lastpage
    1997
  • Abstract
    The junction space-charge-region capacitances are of primary importance for high-speed VLSI bipolar circuit modeling. It is shown in the above paper that the emitter-base junction capacitance model is compact and is in excellent agreement when compared with other relatively complicated models and methods. However, the base-collector junction capacitance model is questionable in the sense that the base-collector junction capacitance becomes more important, rather than being negligible, as suggested by Stubing and Rein, in the high current region. In reply, Rein et al. show that their model is admissible, and give some remarks on Liou´s additional comments. Since the transistor model was developed for high-speed ICs, the numerical examples presented are typical for such circuits. This means, e.g., that the specific resistances and the effective thicknesses of the epitaxial collector are more than about ten times lower than in the example given by Liou.<>
  • Keywords
    bipolar transistors; semiconductor device models; 1D model; VLSI bipolar circuit modeling; base-collector junction capacitance model; effective thicknesses; emitter-base junction capacitance model; epitaxial collector; high current densities; high-speed bipolar transistors; junction space-charge-region capacitances; large-signal model; numerical examples; specific resistances; Analytical models; Bipolar integrated circuits; Bipolar transistors; Capacitance; Doping; Frequency response; Integrated circuit modeling; Semiconductor process modeling; Very large scale integration; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.7417
  • Filename
    7417