DocumentCode
1467886
Title
Comments on "A compact physical large-signal model for high-speed bipolar transistors at high current densities-part I: one-dimensional model" (by H.-M. Rein et al., with reply)
Author
Liou, Juin J. ; Rein, H.-M. ; Schroter, Michael ; Stubing, Hagen
Author_Institution
Dept. of Electr. Eng., Central Florida Univ., Orlando, FL, USA
Volume
35
Issue
11
fYear
1988
Firstpage
1995
Lastpage
1997
Abstract
The junction space-charge-region capacitances are of primary importance for high-speed VLSI bipolar circuit modeling. It is shown in the above paper that the emitter-base junction capacitance model is compact and is in excellent agreement when compared with other relatively complicated models and methods. However, the base-collector junction capacitance model is questionable in the sense that the base-collector junction capacitance becomes more important, rather than being negligible, as suggested by Stubing and Rein, in the high current region. In reply, Rein et al. show that their model is admissible, and give some remarks on Liou´s additional comments. Since the transistor model was developed for high-speed ICs, the numerical examples presented are typical for such circuits. This means, e.g., that the specific resistances and the effective thicknesses of the epitaxial collector are more than about ten times lower than in the example given by Liou.<>
Keywords
bipolar transistors; semiconductor device models; 1D model; VLSI bipolar circuit modeling; base-collector junction capacitance model; effective thicknesses; emitter-base junction capacitance model; epitaxial collector; high current densities; high-speed bipolar transistors; junction space-charge-region capacitances; large-signal model; numerical examples; specific resistances; Analytical models; Bipolar integrated circuits; Bipolar transistors; Capacitance; Doping; Frequency response; Integrated circuit modeling; Semiconductor process modeling; Very large scale integration; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.7417
Filename
7417
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