DocumentCode
1468888
Title
Frequency-Dependent Substrate Characterization via an Iterative Pole Search Algorithm
Author
Demeester, Thomas ; Cauwe, Maarten ; De Zutter, Daniël
Author_Institution
Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium
Volume
21
Issue
4
fYear
2011
fDate
4/1/2011 12:00:00 AM
Firstpage
173
Lastpage
175
Abstract
The characterization of frequency-dependent material properties is an important issue in nowadays high-speed interconnect design. This letter presents a practical method to determine the complex permittivity of a substrate material, by combining measurements with simulations. A rational permittivity model is determined by searching for its poles and residues using an iterative optimization method. Its accuracy is verified by comparing coplanar waveguide measurements with simulations based on the new material model.
Keywords
iterative methods; optimisation; permittivity; search problems; substrate integrated waveguides; frequency-dependent substrate characterization; interconnect design; iterative optimization method; iterative pole search algorithm; rational permittivity model; substrate material permittivity; Conductors; Coplanar waveguides; Microstrip; Permittivity measurement; Substrates; Transmission line measurements; Characterization; dielectric; permittivity; substrate;
fLanguage
English
Journal_Title
Microwave and Wireless Components Letters, IEEE
Publisher
ieee
ISSN
1531-1309
Type
jour
DOI
10.1109/LMWC.2011.2109374
Filename
5728871
Link To Document