LHC RadMon SRAM Detectors Used at Different Voltages to Determine the Thermal Neutron to High Energy Hadron Fluence Ratio

Author

Kramer, D. ; Brugger, M. ; Klupak, V. ; Pignard, C. ; Roeed, K. ; Spiezia, G. ; Viererbl, L. ; Wijnands, T.

Author_Institution

CERN, Geneva, Switzerland

Volume

58

Issue

3

fYear

2011

fDate

6/1/2011 12:00:00 AM

Firstpage

1117

Lastpage

1122

Abstract

The thermal neutron SEU cross-section of the Toshiba SRAM memory used in the LHC RadMon system was measured at different voltages. A method using the difference in its response compared to mixed particle energy field is proposed to be used as a discriminator between thermal neutron and high-energy hadron fluences. For test purposes, the proposed method was used at the CNGS and CERF facilities to estimate the field composition by counting SEUs at two different voltages and the results were compared to simulations.

Keywords

SRAM chips; discriminators; meson detection; neutron detection; nuclear electronics; proton detection; CERF facility; CNGS facility; LHC RadMon SRAM detectors; Toshiba SRAM memory; high energy hadron fluence ratio; thermal neutron SEU cross-section; Detectors; Energy measurement; Large Hadron Collider; Neutrons; Particle beams; Random access memory; Voltage measurement; Large hadron collider (LHC); SEU; SRAM; radiation; thermal neutrons;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2011.2105891

Filename

5728893