Influence of voltage contacts on precision measurements of the quantized Hall resistance: an effect of externally injected current

Author

Chen, T.P. ; Chua, H.A.

Author_Institution

Nat. Meas. Centre, Singapore Production & Stand. Board, Singapore

Volume

47

Issue

2

fYear

1998

fDate

4/1/1998 12:00:00 AM

Firstpage

592

Lastpage

594

Abstract

The influence of the error voltage developed in a nonideal voltage contact by an externally injected current such as the offset current of a nanovolt meter in a four-terminal measurement of the quantized Hall resistance (QHR) has been analyzed, and it was found to be quite significant. Based on the analysis, we have provided some qualitative and even quantitative explanations for the previously reported experimental results by Jeckelmann and Jeanneret on the influence of the voltage contacts on the QHR [1997], which are not explained satisfactorily by the existing theories

Keywords

contact resistance; electric resistance measurement; measurement errors; measurement standards; quantum Hall effect; error voltage; externally injected current effect; four-terminal measurement; nanovolt meter; nonideal voltage contact; nonlinear regime; offset current; precision measurements; quantized Hall resistance; quantum Hall effect; resistance standards; voltage contacts influence; Chemical analysis; Contact resistance; Current measurement; Electrical resistance measurement; Hall effect; Helium; Metallization; Productivity; Standards Board; Voltage measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.744211

Filename

744211