High precision comparison between SNS and SIS Josephson voltage standards

Author

Jeanneret, Blaise ; Rüfenacht, Alain ; Burroughs, Charles J., Jr.

Author_Institution

Swiss Fed. Office of Metrol., Bern-Wabern, Switzerland

Volume

50

Issue

2

fYear

2001

fDate

4/1/2001 12:00:00 AM

Firstpage

188

Lastpage

191

Abstract

Recently, a new Josephson voltage standard based on a 1 V programmable chip provided by the National Institute of Standards and Technology (NIST) was implemented at the Swiss Federal Office of Metrology (OFMET). A comparison with a conventional Josephson voltage standard showed an agreement of (1.4±3.4)×10^-10 at 1 V. This result demonstrates the new system is functioning properly and can be used in various types of measurements. In particular, it will be one of the key components of the Watt balance experiment (1999) at OFMET

Keywords

Josephson effect; Zener diodes; calibration; measurement standards; superconducting arrays; superconducting junction devices; superconducting microwave devices; voltage measurement; 1 V; 1 V programmable chip; Josephson voltage standard; NIST; National Institute of Standards and Technology; OFMET; SIS Josephson voltage standards; SNS Josephson voltage standards; Swiss Federal Office of Metrology; Watt balance experiment; Calibration; Critical current; Diodes; Josephson junctions; Measurement standards; Metrology; NIST; Superconducting device noise; Superconducting devices; Voltage measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.918098

Filename

918098