Error analysis for refractive-index profile determination from near-field measurements

Author

Helms, Jochen ; Schmidtchen, Joachim ; Schüppert, Bernd ; Petermann, Klaus

Author_Institution

Inst. fuer Hochfrequenztech., Berlin, West Germany

Volume

8

Issue

5

fYear

1990

fDate

5/1/1990 12:00:00 AM

Firstpage

625

Lastpage

633

Abstract

Refractive-index profiles of diffused optical waveguides are determined by analyzing the near-field pattern of the waveguide. For this method, a computer simulation of measurement errors due to noise, quantization, defocusing, and nonlinearity of the camera system is presented by using data of a typical camera measurement system. The simulation procedure includes signal processing of the measurement intensity profile by means of a cubic spline approximation in order to reduce the influence of the measurement system errors. The residual errors associated with this technique are on the order of a few percent when measuring typical Ti:LiNbO₃ waveguides

Keywords

cameras; measurement errors; noise; nonlinear optics; optical waveguides; refractive index measurement; LiNbO₃:Ti; camera measurement system; camera system; camera system nonlinearity; computer simulation; cubic spline approximation; defocusing; diffused optical waveguides; measurement errors; measurement intensity profile; near-field measurements; near-field pattern; noise; quantization; refractive-index profile determination; signal processing; Cameras; Computer simulation; Error analysis; Measurement errors; Optical noise; Optical refraction; Optical signal processing; Optical waveguides; Pattern analysis; Quantization;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.54467

Filename

54467