Transport behavior of commercially available 100-Ω standard resistors

Author

Schumacher, Bernd ; Warnecke, Peter ; Poirier, W. ; Delgado, I. ; Msimang, Z. ; Boella, Giorgio ; Hetland, Per Otto ; Elmquist, R.E. ; Williams, J. ; Inglis, Dave ; Jeckelmann, Beat ; Gunnarsson, O. ; Satrapinsky, Alexandre

Author_Institution

Phys. Tech. Bundesanstalt, Braunschweig, Germany

Volume

50

Issue

2

fYear

2001

fDate

4/1/2001 12:00:00 AM

Firstpage

242

Lastpage

244

Abstract

Several types of commercial 100-Ω resistors can be used with the cryogenic current comparator to maintain the resistance unit, derived from the quantized Hall effect (QHE), and to disseminate this unit to laboratory resistance standards. Up until now, the transport behavior of these resistors has not been investigated. Such an investigation is of importance for carrying out comparisons that are close to the level of a direct comparison of two QHE apparatuses. A set of five 100-Ω resistors from three different manufacturers has been sent to 11 participating national metrological institutes. All laboratories but one have measured the resistors based on their laboratory´s quantized Hall resistance measurements. A constant drift model has been applied, and the results are evaluated in such a way that the transport properties of these resistors are treated independently for the different types of resistor. Under certain conditions, these resistors allow comparisons with uncertainties better than 1 part in 10 ⁸

Keywords

current comparators; electric resistance measurement; measurement uncertainty; quantum Hall effect; resistors; transfer standards; 100 ohm; commercially available standard resistors; constant drift model; cryogenic current comparator; laboratory resistance standards; quantized Hall effect; quantized Hall resistance measurement; resistance unit dissemination; transfer standard; transport behavior; uncertainty; Cryogenics; Electrical resistance measurement; Hall effect; Joining processes; Laboratories; Manufacturing; Measurement standards; Metrology; Resistors; Uncertainty;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.918112

Filename

918112