Complete characterization of Zener standards at 10 V for measurement assurance program (MAP)

Author

Tang, Yi-hua ; Sims, June E.

Author_Institution

Div. of Electr., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

Volume

50

Issue

2

fYear

2001

fDate

4/1/2001 12:00:00 AM

Firstpage

263

Lastpage

266

Abstract

A complete characterization of Zener standards for temperature, pressure, and humidity is being performed to improve the uncertainty of a measurement assurance program (MAP) that uses 10 V Zeners as travelling standards. The procedure and equipment used for this work is briefly described. For the Zener standards we have tested, the temperature coefficients range from (1.6 to 5.4) nV/Ω expressed by Zener output change versus thermistor resistance, and the pressure coefficients range from (1 to 20) nV/hPa. The time constant of Zener response to relative humidity change varies from days to nearly infinity. By choosing low noise and nonhumidity sensitive Zeners as transfer standards and correcting for the pressure and temperature effects, the uncertainties of a MAP can be improved

Keywords

Zener diodes; calibration; environmental degradation; transfer standards; voltage measurement; 10 V; Zener output change; Zener voltage standards; calibration; low noise; measurement assurance program; pressure coefficients; relative humidity change; temperature coefficients; thermistor resistance; time constant; travelling standards; uncertainty budget; Electrical resistance measurement; Humidity measurement; Measurement standards; Measurement uncertainty; Performance evaluation; Pressure measurement; Temperature distribution; Testing; Thermal resistance; Thermistors;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.918117

Filename

918117