• DocumentCode
    1472236
  • Title

    A technique for electromagnetic interference measurements on instruments

  • Author

    Angrisani, Leopoldo ; Pietrosanto, Antonio

  • Author_Institution
    Dept. of Comput. Sci. & Electr. Eng., Salerno Univ., Italy
  • Volume
    47
  • Issue
    4
  • fYear
    1998
  • fDate
    8/1/1998 12:00:00 AM
  • Firstpage
    925
  • Lastpage
    929
  • Abstract
    The aim of this paper is to highlight the problems that arise when the immunity of measurement instruments to power line voltage disturbances has to be evaluated. The lack of an international product standard puts at the user´s disposal only some basic standards which, in giving only general criteria for test result classification, make it difficult to choose suitable acceptance criteria and, consequently, to plan a proper set of tests, especially for very complex instruments. After an introduction on the state of art of electromagnetic compatibility (EMC) international standards, a measurement technique adopted by the authors to evaluate the immunity of complex instruments to conducted disturbances is presented. Finally, experimental tests carried out on VXI instruments are given and discussed exhaustively
  • Keywords
    IEC standards; computerised instrumentation; electric variables measurement; electromagnetic compatibility; electromagnetic interference; instruments; measurement standards; measurement systems; EMC international standards; EMI immunity evaluation; EMI measurements; VXI instruments; acceptance criteria; complex instruments; conducted disturbances; electromagnetic compatibility; electromagnetic interference measurements; measurement instruments; measurement technique; power line voltage disturbances; test result classification; Art; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; Immunity testing; Instruments; Measurement standards; Measurement techniques; Power measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.744644
  • Filename
    744644