Measurement and simulation of a CMOS current conveyor negative capacitor for metamaterials

Author

Kshatri, Varun S. ; Covington, John M. C. ; Smith, Kathryn L. ; Shehan, Joshua W. ; Weldon, Thomas P. ; Adams, Ryan S.

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of North Carolina at Charlotte, Charlotte, NC, USA

fYear

2014

fDate

13-16 March 2014

Firstpage

1

Lastpage

5

Abstract

Current conveyors can be used as building blocks for implementing non-Foster circuits such as negative capacitors and negative inductors that are useful in extending bandwidth in metamaterials. In the present paper, measured results are presented for a prototype integrated circuit current conveyor negative capacitor. This circuit has been fabricated in a 0.5 micron CMOS process following previous results. Although CMOS is a desirable technology for circuit implementation, it is accompanied by design challenges of associated parasitic resistance. To investigate these issues, a prototype second generation current conveyor (CCII) is designed and tested in a negative capacitance circuit. In addition, full-wave electromagnetic simulation results are also presented showing the effects of observed resistance on overall metamaterial performance.

Keywords

CMOS integrated circuits; capacitors; circuit simulation; current conveyors; integrated circuit design; integrated circuit measurement; metamaterials; CCII; CMOS current conveyor negative capacitor; CMOS process; full-wave electromagnetic simulation; metamaterial performance; negative capacitance circuit; negative inductors; nonFoster circuits; parasitic resistance; prototype integrated circuit current conveyor negative capacitor; prototype second generation current conveyor; size 0.5 micron; CMOS integrated circuits; Capacitance; Capacitors; Current measurement; Impedance; Metamaterials; Resistance; CMOS; metamaterials; negative capacitance; non-Foster; second generation current conveyor (CCII+);

fLanguage

English

Publisher

ieee

Conference_Titel

SOUTHEASTCON 2014, IEEE

Conference_Location

Lexington, KY

Type

conf

DOI

10.1109/SECON.2014.6950689

Filename

6950689