Can RSFQ logic circuits be scaled to deep submicron junctions?

Author

Kadin, Alan M. ; Mancini, Cesar A. ; Feldman, Marc J. ; Brock, Darren K.

Author_Institution

HYPRES Inc., Elmsford, NY, USA

Volume

11

Issue

1

fYear

2001

fDate

3/1/2001 12:00:00 AM

Firstpage

1050

Lastpage

1055

Abstract

Scaling of niobium RSFQ integrated circuit technology to deep submicron dimensions (linewidths of 300 nm or less) should permit increased clock rate (up to 250 GHz) and increased areal density of Josephson junctions (up to 1 million junctions/cm²), without the need for external shunt resistors. It is shown how existing circuit layouts can be scaled down to these dimensions, while maintaining the precise timing essential for correct operation. Additional issues related to the practical realization of such circuits are discussed, including effects of self-heating and models for the generation and propagation of sub-ps single-flux-quantum pulses

Keywords

niobium; superconducting logic circuits; 250 GHz; 300 nm; Josephson junction; Nb; RSFQ logic circuit; areal density; circuit layout; clock rate; deep submicron scaling; niobium integrated circuit technology; self-heating; superconducting electronics; timing; Clocks; Integrated circuit technology; Josephson junctions; Logic circuits; Niobium; Pulse circuits; Pulse generation; Resistors; Superconducting integrated circuits; Timing;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.919528

Filename

919528